ERMAVSS Workshop on DATE 2016


On March 18th the MoRV Project together with the Clereco project presented a Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems at the DATE 2016 conference. Talks on reliability and aging in digital an analouge circuits were given and posters were presented covering all levels of abstraction from transistor level to register transfer level. For more information on the Workshop, please visit the ERMAVSS website.

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